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> > > The Cascade Microtech Summit 9000 (often co-branded with ALESSI) is an advanced manual to semi-automated analytical probe station designed for precision semiconductor wafer testing. > > It is widely used for DC, RF (Radio Frequency), and microwave measurements, featuring a 6x6-inch chuck and Stereo-magnification microscopy. > > Key Features and Specifications > > Application: Ideal for on-wafer S-parameters, noise parameters, and device characterization. > > Microscope: Typically equipped with a high-magnification trinocular microscope (such as the Leica S6D) with zoom capabilities (7-45x) and video/camera integration. > > Chuck & Travel: Features a 6-inch by 6-inch platen travel and vacuum chucks, often with isolated multi-vacuum zones for stability. > > Probes & Manipulators: Accommodates multiple DC and RF probes simultaneously (e.g., GSG configuration). > > > > TNP Corporation > > TEL: 031-784-8806 E-mail: in2win@naver.com > >
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