
The Cascade Microtech Summit 9000 (often co-branded with ALESSI) is an advanced manual to semi-automated analytical probe station designed for precision semiconductor wafer testing.
It is widely used for DC, RF (Radio Frequency), and microwave measurements, featuring a 6x6-inch chuck and Stereo-magnification microscopy.
Key Features and Specifications
Application: Ideal for on-wafer S-parameters, noise parameters, and device characterization.
Microscope: Typically equipped with a high-magnification trinocular microscope (such as the Leica S6D) with zoom capabilities (7-45x) and video/camera integration.
Chuck & Travel: Features a 6-inch by 6-inch platen travel and vacuum chucks, often with isolated multi-vacuum zones for stability.
Probes & Manipulators: Accommodates multiple DC and RF probes simultaneously (e.g., GSG configuration).
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